Journal of Surface Investigation: X-ray, Synchrotron and Neutron Techniques
ISSN 1027-4510 (Print)
ISSN 1819-7094 (Online)
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Keywords
Raman spectroscopy
X-ray diffraction
X-ray photoelectron spectroscopy
atomic force microscopy
atomic-force microscopy
channeling
ion implantation
magnetron sputtering
microhardness
microstructure
neutron diffraction
scanning electron microscope
scanning electron microscopy
silicon
simulation
small-angle neutron scattering
structure
surface
surface morphology
synchrotron radiation
thin films
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Author Details
Author Details
Gryazev, A. S.
Issue
Section
Title
File
Vol 10, No 1 (2016)
Article
Reflected electron-energy-loss spectra, differential inverse inelastic mean free paths, and angular resolved X-ray photoelectron spectra of a niobium sample
Vol 10, No 1 (2016)
Article
Intrinsic excitation effect for the Al and Mg samples XPS analysis
Vol 10, No 5 (2016)
Article
Differential inverse inelastic mean free path determination on the base of X-ray photoelectron emission spectra
Vol 11, No 4 (2017)
Article
Differential inverse inelastic mean free paths and differential surface excitation probability in aluminium in the energy range of 0.5–120 keV
Vol 12, No 6 (2018)
Article
Depth Profiling Using Reflected Electron Spectroscopy
Vol 13, No 5 (2019)
Article
Determination of the Relative Concentration of Deuterium Implanted into Beryllium by Elastic Peak Electron Spectroscopy
Vol 13, No 5 (2019)
Article
Tungsten-Containing Phases in Diamond-Like Silicon−Carbon Nanocomposites
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