Portable Unilateral NMR Measuring System for Assessing the Aging Status of Silicon Rubber Insulators
- Авторлар: Xu Z.1, Li L.1, Guo P.2, Ji Y.3, Wu J.1, He C.2
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Мекемелер:
- State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University
- School of Physics and Electronic Engineering, Chongqing Normal University
- Chongqing Electric Power Research Institute, State Grid Chongqing Electric Power Company
- Шығарылым: Том 50, № 1-3 (2019)
- Беттер: 277-291
- Бөлім: Original Paper
- URL: https://journals.rcsi.science/0937-9347/article/view/248221
- DOI: https://doi.org/10.1007/s00723-018-1061-7
- ID: 248221
Дәйексөз келтіру
Аннотация
Silicon rubber insulators (SRIs) are widely used in power transmission lines as line support and as insulation between the line and the tower. Given that the aging of SRIs threatens the safety and stability of power grids, the accurate assessment of the aging status of SRIs is crucial. In this study, a portable unilateral magnetic resonance (UMR) measuring system for the nondestructive testing of the aging status of SRIs was proposed. The proposed NMR measurement system includes a mini UMR sensor and a measurement circuit. Details of the mini UMR sensor structure and low-cost circuit design were discussed. The Carr–Purcell–Meiboom–Gill sequence was used to record the 1H transverse relaxation curves of SRI sheds. Inverse Laplace transformation was employed to obtain the T2 distribution, and two peaks in the T2 distribution curve were observed. The long T2 component was selected to quantify the aging degree because of its stability compared with the short T2 component. To eliminate the inaccuracy of measurement introduced by the different chemical structures of SRIs produced by different companies, the aging status of the SRIs was represented by the changes in T2 between the surface and internal materials of the SRI.
Авторлар туралы
Zheng Xu
State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University
Хат алмасуға жауапты Автор.
Email: pinexz@163.com
ҚХР, Chongqing, 400044
Lu Li
State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University
Email: guopan0822@163.com
ҚХР, Chongqing, 400044
Pan Guo
School of Physics and Electronic Engineering, Chongqing Normal University
Хат алмасуға жауапты Автор.
Email: guopan0822@163.com
ҚХР, Chongqing, 401331
Yongliang Ji
Chongqing Electric Power Research Institute, State Grid Chongqing Electric Power Company
Email: guopan0822@163.com
ҚХР, Chongqing, 400020
Jiaming Wu
State Key Laboratory of Power Transmission Equipment and System Security and New Technology, Chongqing University
Email: guopan0822@163.com
ҚХР, Chongqing, 400044
Chuanhong He
School of Physics and Electronic Engineering, Chongqing Normal University
Email: guopan0822@163.com
ҚХР, Chongqing, 401331
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