期 |
栏目 |
标题 |
文件 |
卷 58, 编号 11 (2016) |
On the Jubilee of Vniiofi |
Improvement of the Standards Base for Optophysical Measurements |
|
卷 58, 编号 11 (2016) |
Article |
Metrological Support of Measurements of the Frequency of Radiation in Optical Data Processing Systems |
|
卷 58, 编号 11 (2016) |
Article |
The Creation of the Center of Metrological Assurance of Nanotechnologies and Assessment of the Compliance of the Products of the Nano Industry |
|
卷 58, 编号 11 (2016) |
Article |
Creation of Calibrated Samples of a Measure with Relief Elements Less Than 100 nm |
|
卷 58, 编号 11 (2016) |
Article |
Spectroradiometry of Ultraviolet Radiation |
|
卷 61, 编号 8 (2018) |
Article |
State Primary Standard GET 156-2015 of Units of Spectral Coefficients of Directional Transmission, Diffuse and Specular Reflections in the Wavelength Range from 0.2 to 20.0 μm |
|
卷 61, 编号 9 (2018) |
State Standards |
Improving the State Base of Measurement Standards in the Field of Photonics |
|
卷 61, 编号 9 (2018) |
Article |
Operation and Development of a Center for Collective Use in the Field of Photonics |
|
卷 61, 编号 11 (2019) |
Article |
Spectrophotometric Instruments Incorporated into get 156–2015, the State Primary Standard of the Unit of Spectral Regular Transmittance, Unit of Spectral Diffuse Reflectance, and Unit of Spectral Specular Reflectance in the Range of Wavelengths from 0.2 to 20.0 μm |
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