Optoelectronic Measurement System for a High-Temperature Dilatometer

I. G. Bronshtein; F. M. Inochkin; S. K. Kruglov; T. A. Kompan; S. V. Kondrat’ev; A. S. Korenev; N. F. Pukhov

doi:10.1007/s11018-016-0897-1

Optoelectronic Measurement System for a High-Temperature Dilatometer

作者: Bronshtein I.G.¹, Inochkin F.M.², Kruglov S.K.², Kompan T.A.³, Kondrat’ev S.V.³, Korenev A.S.³, Pukhov N.F.³
隶属关系:
1. St. Petersburg National Research University of Information Technologies, Mechanics, and Optics (ITMO)
2. St. Petersburg Polytechnic University
3. Mendeleev All-Russia Institute of Metrology (VNIIM)
期: 卷 58, 编号 12 (2016)
页面: 1347-1353
栏目: Article
URL: https://journals.rcsi.science/0543-1972/article/view/245632
DOI: https://doi.org/10.1007/s11018-016-0897-1
ID: 245632

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详细

A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported.