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Optoelectronic Measurement System for a High-Temperature Dilatometer


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Resumo

A new optoelectronic measurement system for a high-temperature dilatometer for measuring the thermal expansion of solid samples over a wide temperature range from 1000–3000 K is described. A new method is proposed for measuring the elongation of a sample with corrections for the system parameters during the measurement process. Experimental results are reported.

Sobre autores

I. Bronshtein

St. Petersburg National Research University of Information Technologies, Mechanics, and Optics (ITMO)

Autor responsável pela correspondência
Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

F. Inochkin

St. Petersburg Polytechnic University

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

S. Kruglov

St. Petersburg Polytechnic University

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

T. Kompan

Mendeleev All-Russia Institute of Metrology (VNIIM)

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

S. Kondrat’ev

Mendeleev All-Russia Institute of Metrology (VNIIM)

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

A. Korenev

Mendeleev All-Russia Institute of Metrology (VNIIM)

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

N. Pukhov

Mendeleev All-Russia Institute of Metrology (VNIIM)

Email: kb@jupiter.spb.ru
Rússia, St. Petersburg

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