Автор туралы ақпарат
Morozov, A.
Шығарылым | Бөлім | Атауы | Файл |
Том 60, № 2 (2017) | Nanometrology | Method for Certification Monitoring of Surface Inhomogeneities of Optics Based on Frequency Analysis of the Surface Profile | |
Том 60, № 4 (2017) | Optophysical Measurements | Opto-Electronic System of Measurement of the Coordinates of Objects with Adaptation of Decomposition Parameters |