Author Details
Morozov, A.
Issue | Section | Title | File |
Vol 60, No 2 (2017) | Nanometrology | Method for Certification Monitoring of Surface Inhomogeneities of Optics Based on Frequency Analysis of the Surface Profile | |
Vol 60, No 4 (2017) | Optophysical Measurements | Opto-Electronic System of Measurement of the Coordinates of Objects with Adaptation of Decomposition Parameters |