Metrology of Single Photons for Quantum Information Technologies

S. A. Magnitskii; D. N. Frolovtsev; D. P. Agapov; A. V. Demin; V. N. Krutikov; G. G. Levin

doi:10.1007/s11018-017-1179-2

Metrology of Single Photons for Quantum Information Technologies

Authors: Magnitskii S.A.¹, Frolovtsev D.N.¹, Agapov D.P.¹, Demin A.V.², Krutikov V.N.², Levin G.G.²
Affiliations:
1. Lomonosov Moscow State University
2. All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Issue: Vol 60, No 3 (2017)
Pages: 235-241
Section: Optophysical Measurements
URL: https://journals.rcsi.science/0543-1972/article/view/246102
DOI: https://doi.org/10.1007/s11018-017-1179-2
ID: 246102

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Abstract

A new approach is proposed for the metrology of optical measurements – the quantum metrology of photons. The specific nature of measurements of quantum polarization states of single and polarization-entangled photons is examined. The fundamental objectives of the modern metrology of photons are formulated.