Metrology of Single Photons for Quantum Information Technologies
- Authors: Magnitskii S.A.1, Frolovtsev D.N.1, Agapov D.P.1, Demin A.V.2, Krutikov V.N.2, Levin G.G.2
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Affiliations:
- Lomonosov Moscow State University
- All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
- Issue: Vol 60, No 3 (2017)
- Pages: 235-241
- Section: Optophysical Measurements
- URL: https://journals.rcsi.science/0543-1972/article/view/246102
- DOI: https://doi.org/10.1007/s11018-017-1179-2
- ID: 246102
Cite item
Abstract
A new approach is proposed for the metrology of optical measurements – the quantum metrology of photons. The specific nature of measurements of quantum polarization states of single and polarization-entangled photons is examined. The fundamental objectives of the modern metrology of photons are formulated.
About the authors
S. A. Magnitskii
Lomonosov Moscow State University
Email: demin@vniiofi.ru
Russian Federation, Moscow
D. N. Frolovtsev
Lomonosov Moscow State University
Email: demin@vniiofi.ru
Russian Federation, Moscow
D. P. Agapov
Lomonosov Moscow State University
Email: demin@vniiofi.ru
Russian Federation, Moscow
A. V. Demin
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Author for correspondence.
Email: demin@vniiofi.ru
Russian Federation, Moscow
V. N. Krutikov
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: demin@vniiofi.ru
Russian Federation, Moscow
G. G. Levin
All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Email: demin@vniiofi.ru
Russian Federation, Moscow