Methods for Calibrating High-Resolution Optical Reflectometers Operating in the Frequency Domain

V. V. Grigor’ev; V. E. Kravtsov; A. K. Mityurev; E. A. Moroz; A. O. Pogonyshev; K. B. Savkin

doi:10.1007/s11018-018-1522-2

Methods for Calibrating High-Resolution Optical Reflectometers Operating in the Frequency Domain

Authors: Grigor’ev V.V.¹, Kravtsov V.E.¹, Mityurev A.K.¹, Moroz E.A.¹, Pogonyshev A.O.¹, Savkin K.B.¹
Affiliations:
1. All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Issue: Vol 61, No 9 (2018)
Pages: 903-907
Section: Optophysical Measurements
URL: https://journals.rcsi.science/0543-1972/article/view/246593
DOI: https://doi.org/10.1007/s11018-018-1522-2
ID: 246593

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Abstract

The operating principle of an optical high-resolution reflectometer running in the frequency domain (OFDR reflectometer) is examined. A mathematical model for measuring the parameters of fiber-optic systems using an OFDR reflectometer is presented. The accuracy characteristics of OFDR reflectometers are analyzed and the instrument accuracy is estimated quantitatively. Methods for calibrating OFDR reflectometers based on a distance scale are proposed and equipment for these methods is discussed.