Methods for Calibrating High-Resolution Optical Reflectometers Operating in the Frequency Domain

V. V. Grigor’ev; V. E. Kravtsov; A. K. Mityurev; E. A. Moroz; A. O. Pogonyshev; K. B. Savkin

doi:10.1007/s11018-018-1522-2

Methods for Calibrating High-Resolution Optical Reflectometers Operating in the Frequency Domain

Autores: Grigor’ev V.¹, Kravtsov V.¹, Mityurev A.¹, Moroz E.¹, Pogonyshev A.¹, Savkin K.¹
Afiliações:
1. All-Russia Research Institute of Optophysical Measurements (VNIIOFI)
Edição: Volume 61, Nº 9 (2018)
Páginas: 903-907
Seção: Optophysical Measurements
URL: https://journals.rcsi.science/0543-1972/article/view/246593
DOI: https://doi.org/10.1007/s11018-018-1522-2
ID: 246593

Citar

Texto integral

Acesso aberto
Acesso é fechado

Acesso está concedido
Acesso é fechado

Somente assinantes

Resumo
Sobre autores
Bibliografia
Estatísticas

Resumo

The operating principle of an optical high-resolution reflectometer running in the frequency domain (OFDR reflectometer) is examined. A mathematical model for measuring the parameters of fiber-optic systems using an OFDR reflectometer is presented. The accuracy characteristics of OFDR reflectometers are analyzed and the instrument accuracy is estimated quantitatively. Methods for calibrating OFDR reflectometers based on a distance scale are proposed and equipment for these methods is discussed.