Methods for Calibrating High-Resolution Optical Reflectometers Operating in the Frequency Domain


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The operating principle of an optical high-resolution reflectometer running in the frequency domain (OFDR reflectometer) is examined. A mathematical model for measuring the parameters of fiber-optic systems using an OFDR reflectometer is presented. The accuracy characteristics of OFDR reflectometers are analyzed and the instrument accuracy is estimated quantitatively. Methods for calibrating OFDR reflectometers based on a distance scale are proposed and equipment for these methods is discussed.

作者简介

V. Grigor’ev

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

V. Kravtsov

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

编辑信件的主要联系方式.
Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

A. Mityurev

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

E. Moroz

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

A. Pogonyshev

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

K. Savkin

All-Russia Research Institute of Optophysical Measurements (VNIIOFI)

Email: kravtsov-f3@vniiofi.ru
俄罗斯联邦, Moscow

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