Investigation of heterostructures based on hafnium oxide
- 作者: Sharifullina Y.1, Gumarova I.1,2, Mamin R.2, Nedopekin O.1
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隶属关系:
- Kazan Federal University
- Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
- 期: 卷 87, 编号 4 (2023)
- 页面: 580-586
- 栏目: Articles
- URL: https://journals.rcsi.science/0367-6765/article/view/135366
- DOI: https://doi.org/10.31857/S0367676522701034
- EDN: https://elibrary.ru/MDCZEP
- ID: 135366
如何引用文章
详细
We presented ab initio calculations of bulk structures and thin films of hafnium oxide, and heterostructures based on hafnium oxide in the tetragonal phase and silicon, structural and electronic properties are investigated. The density of states spectra is considered, the results obtained are analyzed, and some of them are compared with previously obtained data (for the studied systems).
作者简介
Y. Sharifullina
Kazan Federal University
编辑信件的主要联系方式.
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan
I. Gumarova
Kazan Federal University; Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan; Russia, 420029, Kazan
R. Mamin
Zavoisky Physical-Technical Institute, FRC Kazan Scientific Center of the Russian Academy of Science
Email: janesharifullina@yandex.ru
Russia, 420029, Kazan
O. Nedopekin
Kazan Federal University
Email: janesharifullina@yandex.ru
Russia, 420008, Kazan
参考
- Gritsenko V.A., Perevalov T.V., Islamov D.R. // Phys. Reports. 2016. V. 613. P. 1.
- Song Ch., Kwon H. // Electronics. 2021. V. 10. Art. No. 2759.
- Воротилов К.А., Сигов А.С. // Нано- и микросист. техника. 2008. Т. 10. С. 30.
- Ishiwara H. // J. Nanosci. Nanotech. 2012. V. 12. Art. No. 7619-27.
- Mikolajick T., Slesazeck S., Mulaosmanovic H. et al. // J. Appl. Phys. 2021. V. 129. Art. No. 100901.
- Tsymbal E., Dagotto E., Eom C., Ramesh R. // In: Multifunctional oxide heterostructures. Oxford: Oxford University Press, 2012. P. 340.
- Sugibuchi K., Kurogi Y., Endo N. // J. Appl. Phys. 1975. V. 46. P. 2877.
- Muller J., Polakowski P., Muller S. et al. // Proc. NVMTS (Pittsburgh, 2016). P. 1.
- Mo F., Tagawa Y., Jin C. et al. // IEEE J. Solid-State Circuits. 2019. V. 11. P. 1.
- Zacharaki C., Tsipas P., Chaitoglou S. et al. // Appl. Phys. Lett. 2019. V. 114. Art. No. 112901.
- Lee Y., Son S., Ham W., Ahn S. // Materials. 2022. V. 15. Art. No. 2251.
- Chanthbouala A, Crassous A., Garcia V. et al. // Nature Nanotech. 2012. V. 7. P. 101.
- Garcia V., Fusil S., Bouzehouane K. et al. // Nature. 2009. V. 460. P. 81.
- Wang P., Yu S. // MRS Commun. 2020. V. 10. P. 538.
- Böscke T., Müller J., Bräuhaus D. et al. // Appl. Phys. Lett. 2011. V. 99. Art. No. 102903.
- Kisi E.H., Howard C.J. // Key Engin. Mater. 1998. V. 153. P. 1.
- Huan T.D., Sharma V., Rossetti G.A., Ramprasad R. // Phys. Rev. B. 2014. V. 90. Art. No. 064111.
- Perdew J.P., Burke K., Ernzerhof M. // Phys. Rev. Lett. 1996. V. 77. № 18. Art. No. 3865.
- Robertson J., Wallace R.M. // Mater. Sci. Engin. R. 2015. V. 88. P. 1.
- Afanas’ev V.V., Stesmans A., Chen F. et al. // Appl. Phys. Lett. 2002. V. 81. Art. No. 1053.
- Adelmann C., Sriramkumar V., Van Elshocht S. et al. // J. Appl. Phys. 2007. V. 91. Art. No. 162902.
- Kresse G., Furthmüller J. // Comp. Mater. Sci. 1996 V. 6. No. 1. P. 15.
- Kresse G., Furthmüller J. // Phys. Rev. B. 1996. V. 54. No. 16. Art. No. 11169.
- Kresse G., Joubert D. // Phys. Rev. B. 1999. V. 59. No. 3. Art. No. 1758.
- MedeA version 3.4. San Diego: Materials Design Inc., 2012.
- Laudadio E., Stipa P., Pierantoni L. et al. // Crystals. 2022. V. 12. P. 2.