Multifractal parametrization for the volume of space forms on surfaces of ZnxCd1–xTe–Si(111) heterocompositions and estimating the energy of a surface with fractal structure
- 作者: Moskvin P.1, Krizhanovskii V.1, Rashkovetskii L.2, Vuichik N.2
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隶属关系:
- Zhitomir State Technological University
- Lashkarev Institute of Semiconductor Physics
- 期: 卷 90, 编号 5 (2016)
- 页面: 1063-1069
- 栏目: Physical Chemistry of Surface Phenomena
- URL: https://journals.rcsi.science/0036-0244/article/view/168244
- DOI: https://doi.org/10.1134/S003602441605023X
- ID: 168244
如何引用文章
详细
Multifractal (MF) analysis is used to describe the volume of space forms on the surfaces of structures in the solid solution of a ZnxCd1–xTe–Si(111) substrate. AFM images of film surfaces have been are used for MF analysis. The parameters of MF spectra are determined for the distribution of volume of surface nanoforms. Based on the formal approach and data on the parameters of the fractal state for the volume and surfaces of nanoforms, an equation is proposed that considers the contribution from the fractal structure of the surface to its surface energy. The behavior of the system’s surface energy, depending on fractal parameters that describe states of the volume and surfaces of nanoforms is discussed.
作者简介
P. Moskvin
Zhitomir State Technological University
编辑信件的主要联系方式.
Email: moskvin@us.ztu.edu.ua
乌克兰, Zhitomir, 10005
V. Krizhanovskii
Zhitomir State Technological University
Email: moskvin@us.ztu.edu.ua
乌克兰, Zhitomir, 10005
L. Rashkovetskii
Lashkarev Institute of Semiconductor Physics
Email: moskvin@us.ztu.edu.ua
乌克兰, Kiev, 03028
N. Vuichik
Lashkarev Institute of Semiconductor Physics
Email: moskvin@us.ztu.edu.ua
乌克兰, Kiev, 03028