Multifractal parametrization for the volume of space forms on surfaces of ZnxCd1–xTe–Si(111) heterocompositions and estimating the energy of a surface with fractal structure
- Authors: Moskvin P.P.1, Krizhanovskii V.B.1, Rashkovetskii L.V.2, Vuichik N.V.2
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Affiliations:
- Zhitomir State Technological University
- Lashkarev Institute of Semiconductor Physics
- Issue: Vol 90, No 5 (2016)
- Pages: 1063-1069
- Section: Physical Chemistry of Surface Phenomena
- URL: https://journals.rcsi.science/0036-0244/article/view/168244
- DOI: https://doi.org/10.1134/S003602441605023X
- ID: 168244
Cite item
Abstract
Multifractal (MF) analysis is used to describe the volume of space forms on the surfaces of structures in the solid solution of a ZnxCd1–xTe–Si(111) substrate. AFM images of film surfaces have been are used for MF analysis. The parameters of MF spectra are determined for the distribution of volume of surface nanoforms. Based on the formal approach and data on the parameters of the fractal state for the volume and surfaces of nanoforms, an equation is proposed that considers the contribution from the fractal structure of the surface to its surface energy. The behavior of the system’s surface energy, depending on fractal parameters that describe states of the volume and surfaces of nanoforms is discussed.
About the authors
P. P. Moskvin
Zhitomir State Technological University
Author for correspondence.
Email: moskvin@us.ztu.edu.ua
Ukraine, Zhitomir, 10005
V. B. Krizhanovskii
Zhitomir State Technological University
Email: moskvin@us.ztu.edu.ua
Ukraine, Zhitomir, 10005
L. V. Rashkovetskii
Lashkarev Institute of Semiconductor Physics
Email: moskvin@us.ztu.edu.ua
Ukraine, Kiev, 03028
N. V. Vuichik
Lashkarev Institute of Semiconductor Physics
Email: moskvin@us.ztu.edu.ua
Ukraine, Kiev, 03028