Multifractal parametrization for the volume of space forms on surfaces of ZnxCd1–xTe–Si(111) heterocompositions and estimating the energy of a surface with fractal structure


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Abstract

Multifractal (MF) analysis is used to describe the volume of space forms on the surfaces of structures in the solid solution of a ZnxCd1–xTe–Si(111) substrate. AFM images of film surfaces have been are used for MF analysis. The parameters of MF spectra are determined for the distribution of volume of surface nanoforms. Based on the formal approach and data on the parameters of the fractal state for the volume and surfaces of nanoforms, an equation is proposed that considers the contribution from the fractal structure of the surface to its surface energy. The behavior of the system’s surface energy, depending on fractal parameters that describe states of the volume and surfaces of nanoforms is discussed.

About the authors

P. P. Moskvin

Zhitomir State Technological University

Author for correspondence.
Email: moskvin@us.ztu.edu.ua
Ukraine, Zhitomir, 10005

V. B. Krizhanovskii

Zhitomir State Technological University

Email: moskvin@us.ztu.edu.ua
Ukraine, Zhitomir, 10005

L. V. Rashkovetskii

Lashkarev Institute of Semiconductor Physics

Email: moskvin@us.ztu.edu.ua
Ukraine, Kiev, 03028

N. V. Vuichik

Lashkarev Institute of Semiconductor Physics

Email: moskvin@us.ztu.edu.ua
Ukraine, Kiev, 03028


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