Low-Frequency Raman Lines as an Indicator of the Presence of Lead in Oxide Materials
- Authors: Shukshin V.E.1, Fedorov P.P.1, Generalov M.E.2
 - 
							Affiliations: 
							
- Prokhorov General Physics Institute, Russian Academy of Sciences
 - Fersman Mineralogical Museum, Russian Academy of Sciences
 
 - Issue: Vol 64, No 11 (2019)
 - Pages: 1442-1445
 - Section: Physical Methods of Investigation
 - URL: https://journals.rcsi.science/0036-0236/article/view/169565
 - DOI: https://doi.org/10.1134/S0036023619100140
 - ID: 169565
 
Cite item
Abstract
Raman spectra were obtained for single- and polycrystalline specimens of some oxide compounds used as quantum electronic materials and for native minerals containing complex anions, where the cations are alkaline-earth metals and lead. An analysis of the low-frequency regions of the Raman spectra showed that, in some cases, the pair of high-intensity lines appearing in the range below 100 cm–1 serves as an indicator of the presence of Pb2+ ions.
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About the authors
V. E. Shukshin
Prokhorov General Physics Institute, Russian Academy of Sciences
														Email: ppfedorov@yandex.ru
				                					                																			                												                	Russian Federation, 							Moscow, 119991						
P. P. Fedorov
Prokhorov General Physics Institute, Russian Academy of Sciences
							Author for correspondence.
							Email: ppfedorov@yandex.ru
				                					                																			                												                	Russian Federation, 							Moscow, 119991						
M. E. Generalov
Fersman Mineralogical Museum, Russian Academy of Sciences
														Email: ppfedorov@yandex.ru
				                					                																			                												                	Russian Federation, 							Moscow, 119991						
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