Low-Frequency Raman Lines as an Indicator of the Presence of Lead in Oxide Materials
- Авторлар: Shukshin V.E.1, Fedorov P.P.1, Generalov M.E.2
-
Мекемелер:
- Prokhorov General Physics Institute, Russian Academy of Sciences
- Fersman Mineralogical Museum, Russian Academy of Sciences
- Шығарылым: Том 64, № 11 (2019)
- Беттер: 1442-1445
- Бөлім: Physical Methods of Investigation
- URL: https://journals.rcsi.science/0036-0236/article/view/169565
- DOI: https://doi.org/10.1134/S0036023619100140
- ID: 169565
Дәйексөз келтіру
Аннотация
Raman spectra were obtained for single- and polycrystalline specimens of some oxide compounds used as quantum electronic materials and for native minerals containing complex anions, where the cations are alkaline-earth metals and lead. An analysis of the low-frequency regions of the Raman spectra showed that, in some cases, the pair of high-intensity lines appearing in the range below 100 cm–1 serves as an indicator of the presence of Pb2+ ions.
Негізгі сөздер
Авторлар туралы
V. Shukshin
Prokhorov General Physics Institute, Russian Academy of Sciences
Email: ppfedorov@yandex.ru
Ресей, Moscow, 119991
P. Fedorov
Prokhorov General Physics Institute, Russian Academy of Sciences
Хат алмасуға жауапты Автор.
Email: ppfedorov@yandex.ru
Ресей, Moscow, 119991
M. Generalov
Fersman Mineralogical Museum, Russian Academy of Sciences
Email: ppfedorov@yandex.ru
Ресей, Moscow, 119991
Қосымша файлдар
