Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes


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Abstract

The surface reconstruction of the textured metal tapes at the temperatures typical for the formation of the seed buffer Y2O3 layer of HTS 2G tapes have been revealed and studied for the first time. The influence of a terrace structure of the substrate surface on the characteristics of the texture of the seed Y2O3 layer has been shown. This effect is critically important to the deposition of buffer layers on the moving tape and allows to expand the temperature range of growth, in which the full inheritance of substrate texture by the seed Y2O3 layer is occurred.

About the authors

M. Y. Chernykh

National Research Center Kurchatov Institute

Author for correspondence.
Email: garaeva-maria@yandex.ru
Russian Federation, Moscow, 123182

T. S. Krylova

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Russian Federation, Moscow, 123182

I. V. Kulikov

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Russian Federation, Moscow, 123182

I. A. Chernykh

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Russian Federation, Moscow, 123182

M. L. Zanaveskin

National Research Center Kurchatov Institute

Email: garaeva-maria@yandex.ru
Russian Federation, Moscow, 123182

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