Influence of High-Temperature Annealing of the Textured Metal Ni–W Substrate on the Structural Properties of Seed Layer in HTS 2G tapes
- Autores: Chernykh M.Y.1, Krylova T.S.1, Kulikov I.V.1, Chernykh I.A.1, Zanaveskin M.L.1
-
Afiliações:
- National Research Center Kurchatov Institute
- Edição: Volume 119, Nº 3 (2018)
- Páginas: 267-271
- Seção: Structure, Phase Transformations, and Diffusion
- URL: https://journals.rcsi.science/0031-918X/article/view/167450
- DOI: https://doi.org/10.1134/S0031918X1803002X
- ID: 167450
Citar
Resumo
The surface reconstruction of the textured metal tapes at the temperatures typical for the formation of the seed buffer Y2O3 layer of HTS 2G tapes have been revealed and studied for the first time. The influence of a terrace structure of the substrate surface on the characteristics of the texture of the seed Y2O3 layer has been shown. This effect is critically important to the deposition of buffer layers on the moving tape and allows to expand the temperature range of growth, in which the full inheritance of substrate texture by the seed Y2O3 layer is occurred.
Sobre autores
M. Chernykh
National Research Center Kurchatov Institute
Autor responsável pela correspondência
Email: garaeva-maria@yandex.ru
Rússia, Moscow, 123182
T. Krylova
National Research Center Kurchatov Institute
Email: garaeva-maria@yandex.ru
Rússia, Moscow, 123182
I. Kulikov
National Research Center Kurchatov Institute
Email: garaeva-maria@yandex.ru
Rússia, Moscow, 123182
I. Chernykh
National Research Center Kurchatov Institute
Email: garaeva-maria@yandex.ru
Rússia, Moscow, 123182
M. Zanaveskin
National Research Center Kurchatov Institute
Email: garaeva-maria@yandex.ru
Rússia, Moscow, 123182
Arquivos suplementares
