X-Ray Luminescence of Zinc Oxide Thick Films


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Abstract

Samples of thick (about 30 μm) films of undoped zinc oxide on sapphire prepared by magnetron sputtering using an uncooled target have been investigated. The structural and luminescence properties of the initial films and films subjected to additional recrystallization annealing in air have been studied. The time and temperature-dependent characteristics of the samples are considered. It is shown that annealing in air enhances the structural, optical, and luminescence properties of these films.

About the authors

I. D. Venevtsev

Peter the Great St. Petersburg Polytechnic University

Author for correspondence.
Email: Venevtsev.Ivan@gmail.com
Russian Federation, St. Petersburg, 195251

P. A. Rodnyi

Peter the Great St. Petersburg Polytechnic University

Email: Venevtsev.Ivan@gmail.com
Russian Federation, St. Petersburg, 195251

A. E. Muslimov

Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences

Email: Venevtsev.Ivan@gmail.com
Russian Federation, Moscow, 119333

V. M. Kanevskii

Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences

Email: Venevtsev.Ivan@gmail.com
Russian Federation, Moscow, 119333

V. A. Babaev

Dagestan State University

Email: Venevtsev.Ivan@gmail.com
Russian Federation, Makhachkala, 367000

A. M. Ismailov

Dagestan State University

Email: Venevtsev.Ivan@gmail.com
Russian Federation, Makhachkala, 367000

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