X-Ray Luminescence of Zinc Oxide Thick Films


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Samples of thick (about 30 μm) films of undoped zinc oxide on sapphire prepared by magnetron sputtering using an uncooled target have been investigated. The structural and luminescence properties of the initial films and films subjected to additional recrystallization annealing in air have been studied. The time and temperature-dependent characteristics of the samples are considered. It is shown that annealing in air enhances the structural, optical, and luminescence properties of these films.

作者简介

I. Venevtsev

Peter the Great St. Petersburg Polytechnic University

编辑信件的主要联系方式.
Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, St. Petersburg, 195251

P. Rodnyi

Peter the Great St. Petersburg Polytechnic University

Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, St. Petersburg, 195251

A. Muslimov

Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences

Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, Moscow, 119333

V. Kanevskii

Federal Scientific Research Center Crystallography and Photonics, Russian Academy of Sciences

Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, Moscow, 119333

V. Babaev

Dagestan State University

Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, Makhachkala, 367000

A. Ismailov

Dagestan State University

Email: Venevtsev.Ivan@gmail.com
俄罗斯联邦, Makhachkala, 367000

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