Raman spectroscopy of the interface between a thin nanostructured ZnO film and fullerene C60

E. A. Zakhidov; M. A. Zakhidova; A. M. Kokhkharov; Sh. K. Nematov; R. A. Nusretov; V. O. Kuvondikov; A. A. Saparbaev

doi:10.1134/S0030400X1704021X

Raman spectroscopy of the interface between a thin nanostructured ZnO film and fullerene C60

作者: Zakhidov E.A.¹, Zakhidova M.A.¹, Kokhkharov A.M.¹, Nematov S.K.¹, Nusretov R.A.¹, Kuvondikov V.O.¹, Saparbaev A.A.¹
隶属关系:
1. Institute of Ion-Plasma and Laser Technologies
期: 卷 122, 编号 4 (2017)
页面: 607-614
栏目: Condensed-Matter Spectroscopy
URL: https://journals.rcsi.science/0030-400X/article/view/165371
DOI: https://doi.org/10.1134/S0030400X1704021X
ID: 165371

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详细

The resonance and nonresonance Raman scattering in the interface between a thin ZnO film with a well-developed nanostructured surface morphology and a layer of fullerene C60 molecules deposited on this film has been investigated. It is shown that the intensity of the interaction between the C60 molecules and ZnO film surface can be estimated based on the spectral scattering characteristics.