Direct arc atomic emission analysis of yttrium, gadolinium, and neodymium oxides


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The analytical potential of direct arc atomic emission detection of impurities in rare earth oxides (Y2O3, Cd2O3, and Nd2O3) on a Grand-Extra high-resolution spectrometer (VMK-Optoelektronika, Russia) is assessed. The conditions of analysis and spectrometer parameters are optimized. The detection threshold and lower limits for the content of a number of rare earth elements (Nd, Eu, Dy, Ho, Gd, Er, Tm, Yb, and Y) in these oxides are determined. The procedure for direct arc atomic emission analysis of yttrium, gadolinium, and neodymium oxides to detect rare earth impurities within the range of 0.001–0.1 wt % is elaborated; the procedure is characterized by improved metrological parameters compared to the standard method.

作者简介

E. Koshel’

State Research and Design Institute of Rare Metal Industry Giredmet; National University of Science and Technology MISiS

编辑信件的主要联系方式.
Email: e-koshel@list.ru
俄罗斯联邦, Moscow; Moscow

V. Baranovskaya

State Research and Design Institute of Rare Metal Industry Giredmet; National University of Science and Technology MISiS

Email: e-koshel@list.ru
俄罗斯联邦, Moscow; Moscow

T. Gubanova

State Research and Design Institute of Rare Metal Industry Giredmet

Email: e-koshel@list.ru
俄罗斯联邦, Moscow

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