X-Ray Photoelectron Spectroscopy Study of Surface-Modified Silicate Glass


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Аннотация

Using characteristics of valence electron and core level X-ray photoelectron spectra at binding energies in the range from 0 to ~1000 eV, we have determined the quantitative elemental composition of the surface of silicate glass samples containing Si, Al, Na, K, Ca, Mg, Fe, S, O, and C, whose surface was modified in different ways. We have identified the oxidation states of the ions in the glasses, which, as expected, correspond to Si4+, Al3+, Na+, K+, Ca2+, and Mg2+. It has been shown that chemical modification of the glass surface produces the largest changes for potassium and sodium: their concentration considerably decreases in comparison with that in the starting glass.

Авторлар туралы

A. Teterin

Kurchatov Institute National Research Centre

Email: gigaset2009@gmail.com
Ресей, pl. Akademika Kurchatova 1, Moscow, 123182

Yu. Teterin

Kurchatov Institute National Research Centre

Email: gigaset2009@gmail.com
Ресей, pl. Akademika Kurchatova 1, Moscow, 123182

K. Maslakov

Moscow State University

Email: gigaset2009@gmail.com
Ресей, Moscow, 119991

E. Murav’ev

AO Solinov Research Institute of Technical Glass

Email: gigaset2009@gmail.com
Ресей, ul. Krzhizhanovskogo 29/5, Moscow, 117218

V. Solinov

AO Solinov Research Institute of Technical Glass

Email: gigaset2009@gmail.com
Ресей, ul. Krzhizhanovskogo 29/5, Moscow, 117218

M. Kustov

AO Solinov Research Institute of Technical Glass

Хат алмасуға жауапты Автор.
Email: gigaset2009@gmail.com
Ресей, ul. Krzhizhanovskogo 29/5, Moscow, 117218

I. Gorina

OAO Saratov Institute of Glass

Email: gigaset2009@gmail.com
Ресей, Moskovskoe sh. 2, Saratov, 410041

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