Impurity composition of monoisotopic 28SiF4 silicon tetrafluoride


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Abstract

The impurity composition of 28SiF4 has been studied for the first time by gas chromatography/mass spectrometry using gas-adsorption capillary columns. For identification and determination of impurity substances by gas chromatography/mass spectrometry, we have proposed using cryogenic preconcentration of the impurities from 28SiF4. The presence of C2–C4 hydrocarbon impurities and sulfur hexafluoride has been confirmed. We have identified 35 impurity substances in 28SiF4, including linear and branched C5–C8 saturated hydrocarbons, aromatic hydrocarbons, chlorine- and fluorine-containing hydrocarbons, and silicon- and sulfur-containing substances, of which 28 have been detected for the first time.

About the authors

T. G. Sorochkina

Devyatykh Institute of Chemistry of High-Purity Substances

Author for correspondence.
Email: sorochkina@ihps.nnov.ru
Russian Federation, ul. Tropinina 49, Nizhny Novgorod, 603951

A. D. Bulanov

Devyatykh Institute of Chemistry of High-Purity Substances

Email: sorochkina@ihps.nnov.ru
Russian Federation, ul. Tropinina 49, Nizhny Novgorod, 603951

A. Yu. Sozin

Devyatykh Institute of Chemistry of High-Purity Substances

Email: sorochkina@ihps.nnov.ru
Russian Federation, ul. Tropinina 49, Nizhny Novgorod, 603951

O. Yu. Chernova

Devyatykh Institute of Chemistry of High-Purity Substances

Email: sorochkina@ihps.nnov.ru
Russian Federation, ul. Tropinina 49, Nizhny Novgorod, 603951

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