Author Details
Mityukhlyaev, V. B.
| Issue | Section | Title | File |
| Vol 53, No 14 (2017) | Analysis of Substances | Evaluation of the Component of Bias of X-Ray Microanalysis Related to Surface Relief of the Specimen | |
| Vol 54, No 14 (2018) | Analysis of Substances | Electron Probe X-Ray Spectral Analysis of Nanoparticles | |
| Vol 54, No 14 (2018) | Analysis of Substances | Electron Probe X-Ray Analysis of Nanofilms at Off-Normal Incidence of the Electron Beam |