Structure, phase composition, and nanohardness of vacuum-annealed multilayer fullerite/aluminum films
- Authors: Baran L.V.1
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Affiliations:
- Belarussian State University
- Issue: Vol 52, No 2 (2016)
- Pages: 113-119
- Section: Article
- URL: https://journals.rcsi.science/0020-1685/article/view/157230
- DOI: https://doi.org/10.1134/S0020168516020011
- ID: 157230
Cite item
Abstract
The influence of the number of layers and thermal annealing on the structure, elemental and phase compositions, and nanohardness of multilayer fullerite/aluminum films has been studied by scanning electron microscopy, atomic force microscopy, X-ray diffraction, X-ray microanalysis, and nanoindentation. The results demonstrate that sequential growth of five aluminum layers and four fullerite layers, each 50 nm in thickness, on oxidized single-crystal silicon substrates leads to the formation of textured films, which retain 111 texture after vacuum annealing at 620 K (τ = 5 h). In the case of the growth of bilayer films of greater thickness, C60(200 nm)/Al(300 nm), the fullerite and aluminum have a polycrystalline structure with no growth texture. Thermal annealing of the bilayer films leads to the formation of a new phase, AlxC60. The materials studied here possess enhanced nanohardness compared to pure aluminum and fullerite films.
Keywords
About the authors
L. V. Baran
Belarussian State University
Author for correspondence.
Email: brlv@mail.ru
Belarus, pr. Nezavisimosti 4, Minsk, 220030
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