Thermal Expansion and Electrical Resistivity of the Intermetallic Compound Ti67Al33

Аннотация

The thermal expansion coefficient and electrical resistivity are measured simultaneously on the same polycrystalline sample of Ti₆₇Al₃₃ in the temperature range of 300−1000 K. The two measured parameters exhibit a qualitative correlation for both the stable and metastable states of the sample. The temperature dependence of the electrical resistivity is shaped by the competition between the semiconductor and metal conductivity mechanisms.