Localization of multiple faults with group control on a discrete device

Abstract

We consider the set of control points in a discrete device where testing is organized in groups with a signature analyzer. We solve the localization problem for a fault of any multiplicity located in one or different groups. For this purpose, in addition we construct various partitions of the set of control points where we organize similar group testing. We show an algorithm for constructing additional partitions. We solve the minimization problem for the testing hardware needed to implement it.