Metrology, Standartization, and Control
| Issue | Title | File | |
| Vol 14, No 3-4 (2019) | INVESTIGATION OF GALLIUM NITRIDE ISLAND FILMS ON SAPPHIRE SUBSTRATES VIA SCANNING ELECTRON MICROSCOPY AND SPECTRAL ELLIPSOMETRY |
 (Eng) |
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| Dedkova A.A., Nikiforov M.O., Mitko S.V., Kireev V.Y. | |||
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