Structure and Properties of the Surface Layer of B4C Ceramic Treated with an Intense Electron Beam


Cite item

Full Text

Open Access Open Access
Restricted Access Access granted
Restricted Access Subscription Access

Abstract

Using transmission and scanning electron microscopy, a pulsed intense electron beam irradiation of a sintered boron carbide ceramic is shown to lead to the formation of a modified surface layer with a nonporous polycrystalline structure and initiate microtwinning and the formation of extended submicron- and nanocrystalline interlayers along the boundaries of boron carbide crystallites. The observed structural changes lead to an increase in the fatigue life of the modified layer.

About the authors

Yu. F. Ivanov

National Research Tomsk Polytechnic University; Institute of High-Current Electronics, Siberian Branch

Author for correspondence.
Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050; Tomsk, 634055

O. L. Khasanov

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

M. S. Petyukevich

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

G. V. Smirnov

Tomsk State University of Control Systems and Radioelectronics

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

V. V. Polisadova

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

Z. G. Bikbaeva

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

A. D. Teresov

Institute of High-Current Electronics, Siberian Branch

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634055

M. P. Kalashnikov

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050

O. S. Tolkachov

National Research Tomsk Polytechnic University

Email: yufi55@mail.ru
Russian Federation, Tomsk, 634050


Copyright (c) 2018 Pleiades Publishing, Ltd.

This website uses cookies

You consent to our cookies if you continue to use our website.

About Cookies