Modification of the structure and properties of tin–fullerite films irradiated by boron ions


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Abstract

By SEM, AFM, electrostatic force microscopy, and X-ray diffraction methods, the structure, phase composition, and local electrical properties of tin–fullerite films implanted with B+ ions (E = 80 keV, F = 5 × 1017 ions/cm–2) are investigated. Ion mixing and solid- phase interaction of tin and fullerite layers are found to occur under ion implantation, and a heterophase structure with nonuniform local electrical properties is formed at the same time.

About the authors

L. V. Baran

Belarusian State University

Author for correspondence.
Email: brlv@mail.ru
Belarus, pr. Nezavisimosti 4, Minsk, 220030


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