Dual band nano structured anti reflection thin film coatings
- Авторы: Iqbal Z.1, Asghar M.H.1, Usman M.2, ul Haq A.1, Ismatullah A.3, Naz N.A.3, Ahmed I.4
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Учреждения:
- Riphah International University, I—14
- Experimental Physics Labs
- Federal Urdu University of Science and Technology
- National Center for Physics, QAU Campus
- Выпуск: Том 52, № 3 (2016)
- Страницы: 481-485
- Раздел: Nanoscale and Nanostructured Materials and Coatings
- URL: https://journals.rcsi.science/2070-2051/article/view/202990
- DOI: https://doi.org/10.1134/S2070205116030138
- ID: 202990
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Аннотация
Dual band (3–5 μm and 8–12 μm) multilayer nano-structured antireflection thin films comprising alternate layers of ZrO2 and SiO2 were deposited on Silicon (100) substrate by RF magnetron sputtering. Peaks of both spectral windows were optimized during the design process to match the peak response of the sensor in the two spectra. The multilayer structure and morphology of the deposited films were analyzed by RBS, XRD, AFM and SEM. The transmission measurements showed an average transmission of Tavg ~ 93% in 3–5 μm and Tavg ~ 83% in 9–12 μm, making the structure effective in both spectral windows and useful in dual channel imaging applications.
Об авторах
Z. Iqbal
Riphah International University, I—14
Автор, ответственный за переписку.
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
M. Asghar
Riphah International University, I—14
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
M. Usman
Experimental Physics Labs
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
A. ul Haq
Riphah International University, I—14
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
A. Ismatullah
Federal Urdu University of Science and Technology
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
Nazir Naz
Federal Urdu University of Science and Technology
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
I. Ahmed
National Center for Physics, QAU Campus
Email: ishaq@ncp.edu.pk
Пакистан, Islamabad
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