On the exact value of the length of the minimal single diagnostic test for a particular class of circuits
- 作者: Popkov K.A.1
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隶属关系:
- Keldysh Institute of Applied Mathematics
- 期: 卷 11, 编号 3 (2017)
- 页面: 431-443
- 栏目: Article
- URL: https://journals.rcsi.science/1990-4789/article/view/212819
- DOI: https://doi.org/10.1134/S1990478917030140
- ID: 212819
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详细
Under consideration is the problem of synthesis of irredundant logic circuits in the basis {&, ∨, ¬} which implement Boolean functions of n variables and allow some short single diagnostic tests regarding uniform constant faults at outputs of gates. For each Boolean function permitting implementation by an irredundant circuit, the minimal possible length value of such a test is found. In particular, we prove that this value is at most 2.
作者简介
K. Popkov
Keldysh Institute of Applied Mathematics
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Email: kirill-formulist@mail.ru
俄罗斯联邦, Miusskaya pl. 4, Moscow, 125047
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