Temperature hysteresis of AgI phase transition in AgI–chalcogenide glass nanolayered films

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详细

Using a method of laser ablation, a number of AgI–chalcogenide glass nanolayered films has been obtained with different thicknesses of the layers (10, 25, 50, and 100 nm). In order to study α ⇆ β phase transition in AgI, X-ray phase analysis has been carried out in the temperature range from 30 to 200°C. A correlation between the layer thickness and the temperature of the α → β phase transition during the lowering of the temperature is found. An explanation of the correlation is proposed.

作者简介

S. Fokina

Institute of Chemistry

Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

A. Kurochkin

Institute of Chemistry

Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

E. Borisov

Institute of Chemistry

Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

M. Krzhizhanovskaya

Institute of Chemistry

Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

M. Bal’makov

Institute of Chemistry

Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

Yu. Tveryanovich

Institute of Chemistry

编辑信件的主要联系方式.
Email: tys@bk.ru
俄罗斯联邦, Universitetskii pr. 26, St. Petersburg, 198504

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