A Study of the Growth of the Maximum and Typical Normalized Dimensions of Strict Young Diagrams
- 作者: Vasiliev N.1, Duzhin V.1
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隶属关系:
- St.Petersburg Department of Steklov Mathematical Institute
- 期: 卷 216, 编号 1 (2016)
- 页面: 53-64
- 栏目: Article
- URL: https://journals.rcsi.science/1072-3374/article/view/237746
- DOI: https://doi.org/10.1007/s10958-016-2887-x
- ID: 237746
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详细
In this paper, we investigate the asymptotics of the normalized dimensions of strict Young diagrams. We describe the results of corresponding computer experiments. The strict Young diagrams parametrize the projective representations of the symmetric group Sn. So, the asymptotics of the normalized dimensions of diagrams gives us the asymptotics of the dimensions of projective representations. Sequences of strict diagrams of high dimension consisting of up to one million boxes were generated. It was proved by an exhaustive search that the first 250 diagrams of all these sequences have the maximum possible dimensions. Presumably, these sequences contain infinitely many diagrams of maximum dimension, and thus give the correct asymptotics of their growth. Also, we investigate the behavior of the normalized dimensions of typical diagrams with respect to the Plancherel measure on the Schur graph. The calculations strongly agree with A. M. Vershik’s conjecture on the convergence of the normalized dimensions of the maximum and Plancherel typical diagrams not only for the standard Young graph, but also for the Schur graph.
作者简介
N. Vasiliev
St.Petersburg Department of Steklov Mathematical Institute
编辑信件的主要联系方式.
Email: vasiliev@pdmi.ras.ru
俄罗斯联邦, St.Petersburg
V. Duzhin
St.Petersburg Department of Steklov Mathematical Institute
Email: vasiliev@pdmi.ras.ru
俄罗斯联邦, St.Petersburg