Wavelet Signal Processing for Resolution Enhancement in a Recurrence Tracking Microscope


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Based on continuous wavelet transform (CWT), we show that the resolution of a recurrence tracking microscope (RTM) is enhanced to subnanometer scale. Our approach helps us to read information on frequency bands, time of revivals, and corresponding time of fractional revivals more accurately. We demonstrate that wavelet analysis provides a deeper information on the phenomena of quantum recurrences in general. Our analytical results show very good agreement with numerical results based on experimental parameters.

作者简介

Naeem Akhtar

Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei

Email: farhan.saif@fullbrightmail.org
中国, Anhui, 230026

Hayat Ullah

Department of Electronics, Quaid-i-Azam University

Email: farhan.saif@fullbrightmail.org
巴基斯坦, Islamabad, 45320

Aiman al Omari

Department of Physics, Jerash University

Email: farhan.saif@fullbrightmail.org
约旦, Jerash

Farhan Saif

Department of Electronics, Quaid-i-Azam University; Department of Physics, Jerash University; Department of Physics, Quaid-i-Azam University

编辑信件的主要联系方式.
Email: farhan.saif@fullbrightmail.org
巴基斯坦, Islamabad, 45320; Jerash; Islamabad, 45320

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