Wavelet Signal Processing for Resolution Enhancement in a Recurrence Tracking Microscope
- 作者: Akhtar N.1, Ullah H.2, al Omari A.3, Saif F.2,3,4
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隶属关系:
- Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei
- Department of Electronics, Quaid-i-Azam University
- Department of Physics, Jerash University
- Department of Physics, Quaid-i-Azam University
- 期: 卷 38, 编号 5 (2017)
- 页面: 399-407
- 栏目: Article
- URL: https://journals.rcsi.science/1071-2836/article/view/248226
- DOI: https://doi.org/10.1007/s10946-017-9660-6
- ID: 248226
如何引用文章
详细
Based on continuous wavelet transform (CWT), we show that the resolution of a recurrence tracking microscope (RTM) is enhanced to subnanometer scale. Our approach helps us to read information on frequency bands, time of revivals, and corresponding time of fractional revivals more accurately. We demonstrate that wavelet analysis provides a deeper information on the phenomena of quantum recurrences in general. Our analytical results show very good agreement with numerical results based on experimental parameters.
作者简介
Naeem Akhtar
Hefei National Laboratory for Physical Sciences Microscale University of Science and Technology of China Hefei
Email: farhan.saif@fullbrightmail.org
中国, Anhui, 230026
Hayat Ullah
Department of Electronics, Quaid-i-Azam University
Email: farhan.saif@fullbrightmail.org
巴基斯坦, Islamabad, 45320
Aiman al Omari
Department of Physics, Jerash University
Email: farhan.saif@fullbrightmail.org
约旦, Jerash
Farhan Saif
Department of Electronics, Quaid-i-Azam University; Department of Physics, Jerash University; Department of Physics, Quaid-i-Azam University
编辑信件的主要联系方式.
Email: farhan.saif@fullbrightmail.org
巴基斯坦, Islamabad, 45320; Jerash; Islamabad, 45320
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