On the Possibility of Two-Dimensional Focusing of Reflected X-Rays from Quartz Single Crystal in the Presence of External Temperature Gradient


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Abstract

The Laue reflection from a quartz single crystal was experimentally studied in the presence of temperature gradient applied perpendicularly to reflecting atomic planes (\(10\bar 11\)), so that a two-dimensional bending of these planes occurs. It is shown that as a result of such an application of temperature gradient to a crystal, the two-dimensional focusing of reflected X-rays is obtained. With increasing temperature gradient the focus of X-rays approaches the crystal more rapidly in the plane of reflection than in the perpendicular one.

About the authors

V. R. Kocharyan

National Research Tomsk Polytechnical University; Institute of Applied Problems of Physics

Author for correspondence.
Email: vahan2@yandex.ru
Russian Federation, Tomsk; Yerevan

A. E. Movsisyan

Institute of Applied Problems of Physics

Email: vahan2@yandex.ru
Armenia, Yerevan

A. S. Gogolev

National Research Tomsk Polytechnical University

Email: vahan2@yandex.ru
Russian Federation, Tomsk

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