On the Possibility of Two-Dimensional Focusing of Reflected X-Rays from Quartz Single Crystal in the Presence of External Temperature Gradient
- Authors: Kocharyan V.R.1,2, Movsisyan A.E.2, Gogolev A.S.1
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Affiliations:
- National Research Tomsk Polytechnical University
- Institute of Applied Problems of Physics
- Issue: Vol 53, No 3 (2018)
- Pages: 263-269
- Section: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228694
- DOI: https://doi.org/10.3103/S106833721803012X
- ID: 228694
Cite item
Abstract
The Laue reflection from a quartz single crystal was experimentally studied in the presence of temperature gradient applied perpendicularly to reflecting atomic planes (\(10\bar 11\)), so that a two-dimensional bending of these planes occurs. It is shown that as a result of such an application of temperature gradient to a crystal, the two-dimensional focusing of reflected X-rays is obtained. With increasing temperature gradient the focus of X-rays approaches the crystal more rapidly in the plane of reflection than in the perpendicular one.
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About the authors
V. R. Kocharyan
National Research Tomsk Polytechnical University; Institute of Applied Problems of Physics
Author for correspondence.
Email: vahan2@yandex.ru
Russian Federation, Tomsk; Yerevan
A. E. Movsisyan
Institute of Applied Problems of Physics
Email: vahan2@yandex.ru
Armenia, Yerevan
A. S. Gogolev
National Research Tomsk Polytechnical University
Email: vahan2@yandex.ru
Russian Federation, Tomsk
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