Memristive Effect in Two-Layered Structures Based on Lithium Doped ZnO Films
- Authors: Igityan A.S.1, Aghamalyan N.R.1, Petrosyan S.I.1, Kafadaryan Y.A.1
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Affiliations:
- Institute for Physical Research
- Issue: Vol 53, No 1 (2018)
- Pages: 58-64
- Section: Article
- URL: https://journals.rcsi.science/1068-3372/article/view/228561
- DOI: https://doi.org/10.3103/S1068337218010073
- ID: 228561
Cite item
Abstract
The structure of Au/Li10ZnO/Li1ZnO/LaB6 consisting of upper Au and lower LaB6 ohmic electrodes and a p-n junction p-Li10ZnO/n-Li1ZnO, which has the resistive memory where two functions are simultaneously combined, that is, an address access and the process of reading and storing of information is investigated. The resistance ratio (Rreset/Rset = 10), the data storage time (> 3 hours) and the number of switching cycles (> 350) are improved as compared to the corresponding single-layer structures. The resistive memory is explained by the modulation effect of the Li10ZnO layer, the ferroelectric polarization of which, depending on the orientation, changes the width and height of the barrier of the p-n junction formed at the p-Li10ZnO/n-Li1ZnO contact.
Keywords
About the authors
A. S. Igityan
Institute for Physical Research
Email: info@pleiadesonline.com
Armenia, Ashtarak
N. R. Aghamalyan
Institute for Physical Research
Email: info@pleiadesonline.com
Armenia, Ashtarak
S. I. Petrosyan
Institute for Physical Research
Email: info@pleiadesonline.com
Armenia, Ashtarak
Y. A. Kafadaryan
Institute for Physical Research
Email: info@pleiadesonline.com
Armenia, Ashtarak