Hard X-ray diffraction in quartz single crystals in the presence of temperature gradient

Abstract

The diffraction of hard X-rays in quartz single crystals is considered in the Laue geometry in the presence of temperature gradient. Spectral and angular characteristics of the reflected beam were experimentally studied versus the magnitude of temperature gradient. It is shown that as the temperature gradient applied perpendicular to reflecting (10ī1) atomic planes of quartz single crystal increases, the focus of reflected beam approaches the crystal, the angular and spectral widths increase, and intensity increases by orders of magnitude.