Laser emission efficiency of semiconductor target of gas diode in the picosecond range


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Abstract

Laser radiation excited in a cadmiumsulfide semiconductor target (ST) (λ = 522 nm) by a high-intensity subnanosecond electron beam (EB) with an energy of 70–150 keV has a maximum intensity of 3 · 107W/cm2 at an efficiency of~10%. Lasing arose at the EB exciting pulse front. The laser radiation pulse shape reproduced the EB pulse shape.

About the authors

A. S. Nasibov

Lebedev Physical Institute

Author for correspondence.
Email: nasibov@sci.lebedev.ru
Russian Federation, Leninskii pr. 53, Moscow, 119991

K. V. Berezhnoy

Lebedev Physical Institute

Email: yalandin@iep.uran.ru
Russian Federation, Leninskii pr. 53, Moscow, 119991

M. B. Bochkarev

Institute of Electrophysics, Ural Branch

Email: yalandin@iep.uran.ru
Russian Federation, ul. Amundsena 106, Ekaterinburg, 620016

A. G. Sadykova

Institute of Electrophysics, Ural Branch

Email: yalandin@iep.uran.ru
Russian Federation, ul. Amundsena 106, Ekaterinburg, 620016

S. A. Shunailov

Institute of Electrophysics, Ural Branch

Email: yalandin@iep.uran.ru
Russian Federation, ul. Amundsena 106, Ekaterinburg, 620016

M. I. Yalandin

Institute of Electrophysics, Ural Branch

Author for correspondence.
Email: yalandin@iep.uran.ru
Russian Federation, ul. Amundsena 106, Ekaterinburg, 620016

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