Electrochemical corrosion of thin ferromagnetic Fe—N films in neutral solution


Цитировать

Полный текст

Открытый доступ Открытый доступ
Доступ закрыт Доступ предоставлен
Доступ закрыт Только для подписчиков

Аннотация

A model experiment was conducted in order to determine an interplay between inherent strains and electrochemical corrosion rate in nitrogen-doped iron thin films. 150 and 300 nm thick films, used in the experiment, were obtained by means of DC magnetron sputtering. In order to study the influence of substrate on inherent strains in metal, these films were deposited onto flexible polymer and rigid glass substrates. It was found, that the rigidity of the substrate increased the corrosion rate of thin iron films in a neutral electrolytic solution. It was proven using X-ray diffraction, that the greater rigidity was, the stronger were the internal strains within the films. That effect was especially pronounced in thinner films, where the increase in the rate of dissolution was accompanied by a localization of corrosion. Characteristics of electrochemical processes were measured using a three-electrode cell. The comparison of the films free surface energy was performed by measuring water contact angle.

Об авторах

S. Maklakov

Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences

Автор, ответственный за переписку.
Email: squirrel498@gmail.com
Россия, 13 ul. Izhorskaya, Moscow, 125412

S. Maklakov

Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences

Email: squirrel498@gmail.com
Россия, 13 ul. Izhorskaya, Moscow, 125412

A. Naboko

Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences

Email: squirrel498@gmail.com
Россия, 13 ul. Izhorskaya, Moscow, 125412

V. Polozov

Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences; Moscow Institute of Physics and Technology

Email: squirrel498@gmail.com
Россия, 13 ul. Izhorskaya, Moscow, 125412; 9 Institutskiy per., Dolgoprudny, Moscow Region, 9141700

V. Amelichev

SuperOx

Email: squirrel498@gmail.com
Россия, 20/2 Nauchnyi proezd, Moscow, 117246

I. Ryzhikov

Institute for Theoretical and Applied Electromagnetics, Russian Academy of Sciences

Email: squirrel498@gmail.com
Россия, 13 ul. Izhorskaya, Moscow, 125412

Дополнительные файлы

Доп. файлы
Действие
1. JATS XML

© Springer Science+Business Media, LLC, 2017

Согласие на обработку персональных данных

 

Используя сайт https://journals.rcsi.science, я (далее – «Пользователь» или «Субъект персональных данных») даю согласие на обработку персональных данных на этом сайте (текст Согласия) и на обработку персональных данных с помощью сервиса «Яндекс.Метрика» (текст Согласия).