Quality Control of ZnGeP2 Single Crystals Using Optical Methods
- Autores: Dyomin V.V.1, Polovtsev I.G.1, Kamenev D.V.1
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Afiliações:
- National Research Tomsk State University
- Edição: Volume 58, Nº 10 (2016)
- Páginas: 1479-1481
- Seção: Article
- URL: https://journals.rcsi.science/1064-8887/article/view/236795
- DOI: https://doi.org/10.1007/s11182-016-0672-4
- ID: 236795
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Resumo
A method for detection of subsurface defects in ZnGeP2crystals is proposed. Evaluation of this method is performed and experimental results are presented.
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Sobre autores
V. Dyomin
National Research Tomsk State University
Email: kamenev87@mail.ru
Rússia, Tomsk
I. Polovtsev
National Research Tomsk State University
Email: kamenev87@mail.ru
Rússia, Tomsk
D. Kamenev
National Research Tomsk State University
Autor responsável pela correspondência
Email: kamenev87@mail.ru
Rússia, Tomsk
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