Characteristics of a Silicon Avalanche Photodiode for the Near-IR Spectral Range


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The sensitivity at wavelengths in the range 400–1150 nm, dark current, and dynamic characteristics of an silicon avalanche photodiode with an active region 1.5 mm in diameter that we developed have been examined. It has been shown that the avalanche photodiode has the following set of characteristics: sensitivity 80–85 A/W at wavelengths of 900–1010 nm, dark current 1.5 nA, and leading and trailing edges shorter than 2.5 ns at a reverse bias voltage of 350 V.

作者简介

P. Aruev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

B. Ber

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

A. Gorokhov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

V. Zabrodskii

Ioffe Physical Technical Institute, Russian Academy of Sciences

编辑信件的主要联系方式.
Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

D. Kazantsev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

A. Nikolaev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

V. Filimonov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

M. Shvarts

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg

E. Sherstnev

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: sildet@mail.ioffe.ru
俄罗斯联邦, St. Petersburg


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