The Effect of the Doping Level of Starting Silicon Single Crystals on Structural Parameters of Porous Silicon Produced by Electrochemical Etching


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The effect of comparatively small changes in the free carrier concentration in a heavily doped p‑type single-crystal silicon on the structural parameters of porous layers formed as a result of its anodic etching has been found. The pronounced influence exerted by the hole concentration on the structural porous silicon parameters being studied is explained on the basis of the concept of electrochemical pore-formation in silicon crystals as a self-organized cooperative process accompanied by the injection of electrons from the region of the chemical reaction at the propagation front of pores.

Sobre autores

A. Zegrya

Ioffe Physical Technical Institute, Russian Academy of Sciences

Autor responsável pela correspondência
Email: zegrya@bk.ru
Rússia, St. Petersburg, 194021

V. Sokolov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: zegrya@bk.ru
Rússia, St. Petersburg, 194021

G. Zegrya

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: zegrya@bk.ru
Rússia, St. Petersburg, 194021

Yu. Ganin

Institute for Chemical Physics Problems, Russian Academy of Sciences

Email: zegrya@bk.ru
Rússia, Chernogolovka, Moscow oblast, 142432

Yu. Mikhailov

Institute for Chemical Physics Problems, Russian Academy of Sciences

Email: zegrya@bk.ru
Rússia, Chernogolovka, Moscow oblast, 142432

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