The Influence of EL2 Centers on the Photoelectric Response of an Array of Radial GaAs/AlGaAs Nanowires
- Authors: Grigorieva N.R.1, Shtrom I.V.1,2, Grigoriev R.V.1, Soshnikov I.P.2,3,4, Reznik R.R.5, Samsonenko Y.B.2, Sibirev N.V.1,5, Cirlin G.E.3,6
-
Affiliations:
- St. Petersburg State University
- Institute for Analytical Instrumentation, Russian Academy of Sciences
- St. Petersburg Academic University, Russian Academy of Sciences
- Ioffe Physical Technical Institute, Russian Academy of Sciences
- St. Petersburg University of Information Technologies, Mechanics, and Optics (ITMO University)
- St. Petersburg Electrotechnical University LETI
- Issue: Vol 45, No 8 (2019)
- Pages: 835-838
- Section: Article
- URL: https://journals.rcsi.science/1063-7850/article/view/208406
- DOI: https://doi.org/10.1134/S1063785019080212
- ID: 208406
Cite item
Abstract
We have studied the role of EL2 centers in formation of the photoelectric response of an array of radial n-type GaAs/AlxGa1 –xAs (x = 0.3) nanowires (NWs) grown by molecular beam epitaxy on a p-type silicon substrate. Results revealed a significant decrease in the time of NW photoresponse recovery as compared to that in a bulk crystal upon the transition of EL2 centers from a metastable nonactive state to the normal ground state.
About the authors
N. R. Grigorieva
St. Petersburg State University
Author for correspondence.
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 199034
I. V. Shtrom
St. Petersburg State University; Institute for Analytical Instrumentation, Russian Academy of Sciences
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 199034; St. Petersburg, 198095
R. V. Grigoriev
St. Petersburg State University
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 199034
I. P. Soshnikov
Institute for Analytical Instrumentation, Russian Academy of Sciences; St. Petersburg Academic University, Russian Academy of Sciences; Ioffe Physical Technical Institute, Russian Academy of Sciences
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 198095; St. Petersburg, 194021; St. Petersburg, 194021
R. R. Reznik
St. Petersburg University of Information Technologies, Mechanics, and Optics (ITMO University)
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 197101
Yu. B. Samsonenko
Institute for Analytical Instrumentation, Russian Academy of Sciences
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 198095
N. V. Sibirev
St. Petersburg State University; St. Petersburg University of Information Technologies, Mechanics, and Optics (ITMO University)
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 199034; St. Petersburg, 197101
G. E. Cirlin
St. Petersburg Academic University, Russian Academy of Sciences; St. Petersburg Electrotechnical University LETI
Email: n.r.grigorieva@spbu.ru
Russian Federation, St. Petersburg, 194021; St. Petersburg, 197376