Stress Relaxation in CrSi2 Crystals Grown under Microgravity Conditions from Zn Melt in the Cr–Si–Zn System


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Experimental data obtained in a study of CrSi2 microcrystals grown under microgravity conditions from a Zn melt in the Cr–Si–Zn system by the mass crystallization method and then placed in terrestrial conditions are presented and analyzed. New properties of crystals of this kind are observed.

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E. Kalashnikov

Ioffe Physical Technical Institute, Russian Academy of Sciences; Moscow State Regional University

编辑信件的主要联系方式.
Email: ekevkalashnikov1@gmail.com
俄罗斯联邦, St. Petersburg, 194021; Mytishchi, Moscow oblast, 141014

V. Gurin

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
俄罗斯联邦, St. Petersburg, 194021

S. Nikanorov

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
俄罗斯联邦, St. Petersburg, 194021

M. Yagovkina

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
俄罗斯联邦, St. Petersburg, 194021

L. Derkachenko

Ioffe Physical Technical Institute, Russian Academy of Sciences

Email: ekevkalashnikov1@gmail.com
俄罗斯联邦, St. Petersburg, 194021

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