Specific Features of the Luminescence of ZnO:Te/GaN/Al 2 O 3  Heterostructures

A. M. Bagamadova; A. Sh. Asvarov; A. K. Omaev; M. E. Zobov

doi:10.1134/S1063785018120398

Specific Features of the Luminescence of ZnO:Te/GaN/Al₂O₃ Heterostructures

Authors: Bagamadova A.M.¹, Asvarov A.S.¹, Omaev A.K.¹, Zobov M.E.¹
Affiliations:
1. Amirkhanov Institute of Physics, Dagestan Scientific Center
Issue: Vol 44, No 12 (2018)
Pages: 1142-1144
Section: Article
URL: https://journals.rcsi.science/1063-7850/article/view/208128
DOI: https://doi.org/10.1134/S1063785018120398
ID: 208128

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Abstract

High-quality heteroepitaxial (0001)ZnO:Te/(0001)GaN/(0001)Al₂O₃ structures have been grown by hydrogen vapor-phase epitaxy in a low-pressure continuous flow reactor. X-ray diffraction analysis of these heterostructures has been carried out, which revealed the high structural quality of thin zinc oxide layers. The surface morphology and specific features of UV photoluminescence of the ZnO/GaN/Al₂O₃ heterostructure have been analyzed.