Absolutely Calibrated Spectrally Resolved Measurements of Xe Laser Plasma Radiation Intensity in the EUV Range
- Авторы: Butorin P.1, Zadiranov Y.2, Zuev S.3, Kalmykov S.2, Polkovnikov V.3, Sasin M.2, Chkhalo N.3
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Учреждения:
- Peter the Great St. Petersburg Polytechnic University
- Ioffe Institute
- Institute for Physics of Microstructures, Russian Academy of Sciences
- Выпуск: Том 63, № 10 (2018)
- Страницы: 1507-1510
- Раздел: Optics
- URL: https://journals.rcsi.science/1063-7842/article/view/202175
- DOI: https://doi.org/10.1134/S1063784218100080
- ID: 202175
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Аннотация
With the aid of Mo/Be and Si/Mo interference mirrors, measurements of radiation intensity from laser plasma with Xe gas-jet target have been realized within a wavelength interval of 11–14 nm with a spectral resolution of 3–6 Å. The results are compared with the spectrum formerly measured with the aid of a spectrograph. The ratio of intensities at wavelengths of 11.2 and 13.5 nm has been found to be about 10 under experimental conditions studied.
Об авторах
P. Butorin
Peter the Great St. Petersburg Polytechnic University
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, St. Petersburg, 195251
Yu. Zadiranov
Ioffe Institute
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, St. Petersburg, 194021
S. Zuev
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, Nizhny Novgorod, 603950
S. Kalmykov
Ioffe Institute
Автор, ответственный за переписку.
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, St. Petersburg, 194021
V. Polkovnikov
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, Nizhny Novgorod, 603950
M. Sasin
Ioffe Institute
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, St. Petersburg, 194021
N. Chkhalo
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Россия, Nizhny Novgorod, 603950