Absolutely Calibrated Spectrally Resolved Measurements of Xe Laser Plasma Radiation Intensity in the EUV Range
- Авторлар: Butorin P.1, Zadiranov Y.2, Zuev S.3, Kalmykov S.2, Polkovnikov V.3, Sasin M.2, Chkhalo N.3
-
Мекемелер:
- Peter the Great St. Petersburg Polytechnic University
- Ioffe Institute
- Institute for Physics of Microstructures, Russian Academy of Sciences
- Шығарылым: Том 63, № 10 (2018)
- Беттер: 1507-1510
- Бөлім: Optics
- URL: https://journals.rcsi.science/1063-7842/article/view/202175
- DOI: https://doi.org/10.1134/S1063784218100080
- ID: 202175
Дәйексөз келтіру
Аннотация
With the aid of Mo/Be and Si/Mo interference mirrors, measurements of radiation intensity from laser plasma with Xe gas-jet target have been realized within a wavelength interval of 11–14 nm with a spectral resolution of 3–6 Å. The results are compared with the spectrum formerly measured with the aid of a spectrograph. The ratio of intensities at wavelengths of 11.2 and 13.5 nm has been found to be about 10 under experimental conditions studied.
Авторлар туралы
P. Butorin
Peter the Great St. Petersburg Polytechnic University
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, St. Petersburg, 195251
Yu. Zadiranov
Ioffe Institute
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
S. Zuev
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, Nizhny Novgorod, 603950
S. Kalmykov
Ioffe Institute
Хат алмасуға жауапты Автор.
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
V. Polkovnikov
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, Nizhny Novgorod, 603950
M. Sasin
Ioffe Institute
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, St. Petersburg, 194021
N. Chkhalo
Institute for Physics of Microstructures, Russian Academy of Sciences
Email: Serguei.Kalmykov@mail.ioffe.ru
Ресей, Nizhny Novgorod, 603950